Tektronix MI 5010
Multifunction Interface Plug In
Description
This Plug In consists of the MI 5010 Multifunction Interface and six different function cards.
These cards are capable of a variety of functions typically required in ATE Automatic Test Equipment, and functional testing system interfacing, data acquisition and generation, and process control.
In addition to providing power to function, the unit has sequencing capability, time of day clock, command buffer, and self diagnostics.
Cards rapidly slide in and out of the unit system for a fast flexible approach to test.
Alternatively, for dedicated applications, card configuration can be secured in the unit with rear locking screws.
Key Points
Programmable Stimulus and Measurement System
Controller Free Test Sequencing using Internal Command Buffer
Analog and Digital lnput Output
Single Ended and Guarded Differential Signal Scanning
Word Acquisition and Generation
Customized Programmable Instrumentation
Specifications
Programmable Stimulus and Measurement System
Controller Free Test Sequencing using Internal Command Buffer
Analog and Digital lnput Output
Single Ended and Guarded Differential Signal Scanning
Word Acquisition and Generation
Customized Programmable Instrumentation