Tektronix 172
Programmable Test Fixture
Description
This Programmable Test Fixture is used with the 576 Curve Tracer, this module permits you to program a sequence of tests of J FETs, transistors, and diodes.
Performs up to eleven preprogrammed different tests on each device.
A variable rate control is provided to allow the operator a comfortable level of activity or the tests may be sequenced manually.
Tests include measurement of Hfe, Vce, Iceo, Ices, Icer, Icbo, Iebo and for J FET's: Vp, Idss, Rds, Igss and BVgss.
Key Points
Drive the device under test to 10A peak or 500V
Measurement of Hfe, Vce, Iceo, Ices, Icer, Icbo, Iebo and for J FET's: Vp, Idss, Rds, Igss and BVgss.
Specifications
Instrument Type: Programmable Test Fixture
Used with: 576 Curve Tracer