Keithley 4500-MTS
Multi Channel I V Test System
Description
This Multi-Channel I V Test System is a DC source measure test system that is optimized for high speed parallel testing.
This multi channel system supports up to 36 source measure channels while automatically managing complex channel coordination tasks such as inter channel triggering and communications.
In addition, this unit reduces system complexity by eliminating the need for external trigger control and instrument communications buses.
Key Points
4 to 36 source-measure channels
Supports parallel testing with up to 8 autonomous groups of channels
Real-time parallel source and measurement sequences
Fast measurement integration rates as short as 0.002 NPLC
Easy to program parallel I-V sweeps and step-and-sweep sequences
Open PC/PCI architecture allows easy integration of software and hardware
Software drivers optimized for popular test development environments
Specifications
Instrument Type: Multi Channel I V Test System
Source measure channels: 4 to 36
DC sources: up to 10V @ 10mA or 1A @ 6V
