Ando AQ6317C
50GHz Optical Spectrum Analyzer
Description
The AQ6317C Optical Spectrum Analyzer more than meets the latest needs, with its new waveform analysis function, S-, C- and L-band coverage, superior wavelength accuracy throughout the measurement range, faster measurement speeds in high-sensitivity mode and capability to improve manufacturing throughput. Achieves high wavelength accuracy of ±0.1 nm for the entire range from 600 to 1750 nm, and to ±0.02 to ±0.04 nm at 1450 to 1620 nm (S-, C- and L-band). Achieves wavelength resolution of 0.015 nm or less, enabling analysis of WDM signals at 25 GHz spacing. Analysis functions for WDM and other optical devices such as LD, LED and FBG. In conjunction with the AQ4321A/4321D Tunable Laser Source, much higher wavelength resolution/wide dynamic range can be achieved by high-speed synchronous sweep at a maximum of 10 nm/second. High sensitivity allows measurement of light at down to –90 dBm, covering from 1200 to 1600 nm. With possible measurement of up to +20 dBm per one resolution, WDM optical amplifiers and high-powered laser diodes can be measured directly. Twice the measurement speed of conventional spectrum analyzers in high-sensitivity mode The dynamic range is 70dB or more at peak ±0.4 nm and 60 dB at peak ±0.2 nm for optimal 50 GHz spacing WDM signal analysis performance. Polarization dependency reduced to ±0.05 dB, for accurate optical amplifier gain and other critical measurements. Accurate within ±0.3 dB. Pulsed light measurement function Three individual trace memories
Key Points
High wavelength accuracy
High wavelength resolution
Enhanced measurement speed
Wide dynamic range
Versatile analysis functions
Synchronous sweep
Wide-band, high-sensitivity, high-power measurement
Low polarization dependency
High level accuracy
Large 9.4-inch color display
Pulsed light measurement function
Three individual trace memories
Specifications
Measurement wavelength range: 600 to 1750 nm
Display:9.4-inch color LCD (Resolution: 640 x 480 dots)
Power requirements:AC 100 to 120 (±10%)/200 to 240 V (±10%), 50/60 Hz, approx. 200 VA
Wavelength repeatability:±0.005 nm (1 min)
Dimensions and mass:Approx. 425 (W) x 222 (H) x 450 (D) mm, approx. 30 kg
Wavelength accuracy:
±0.02 nm (1520 to 1580 nm, after calibration with built-in reference light source)
±0.04 nm (1450 to 1520 nm, 1580 to 1620 nm, after calibration with built-in reference light source)
±0.1 nm (600 to 1750 nm, after calibration with built-in reference light source
Wavelength linearity:
±0.01 nm (1520 to 1580 nm)
±0.02 nm (1450 to 1520nm, 1580 to 1620 nm)
Wavelength resolution:
Max. resolution: 0.015 nm or less (1520 to 1620 nm,
RESOLN: 0.01 nm)
Resolution setting: 0.01, 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0 nm
Measurement level range:
-90 to +20 dBm (1200 to 1650 nm, SENS: HIGH 3)
-80 to +20 dBm (1000 to 1200 nm, SENS: HIGH 3)
-60 to +20 dBm (600 to 1000 nm, SENS: HIGH 3)
Dynamic range:
60 dB (1523 nm, peak: ±0.2 nm, resolution: 0.01 nm)
70 dB (1523 nm, peak: ±0.4 nm, resolution: 0.01 nm)
45 dB (1523 nm, peak: ±0.2 nm, resolution: 0.1 nm)
Sweep time:
Approx. 500 ms (SPAN: 100 nm or less, SENS: NORM HOLD, AVR: 1, SMPL: 501, resolution correction: OFF)
Approx. 0.5 min (SPAN: 100 nm or less, SENS: HIGH 2, AVR: 1,SMPL: 501, No signal)
Environmental conditions:
Operating temperature: 5 to 40 ºC
Storage temperature: -10 to +50 ºC
Humidity: 80 % RH or less (no condensation)
