Agilent / HP / Keysight E5080B

The New Standard

As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 53 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability. 

• Wide frequency coverage from 9 kHz to 4.5/6.5/9/14/20 GHz or 100 kHz to 26.5/32/44/53 GHz
• Fully capture device performance with a wide dynamic range of 140 dB
• Achieve complete device characterization with optional built in DC sources, bias tees, pulse generators and pulse modulators

• Consistently test between R&D and production with the same UI and SCPI commands as high-end PNAs
• Improve throughput by performing spectrum analysis, pulsed-RF measurements, vector mixer measurements, noise figure, and more on a single instrument