Agilent / HP 4145B
Semiconductor Parameter Analyzer
Description
This is a fully automatic, high speed DC characterization of semiconductor devices.
Sourcing and measurement 50fA to 100mA and 1mV to 100V.
Up to 1140 measurement and display points for precise measurement and analysis.
Flexible graphic analysis for quick parameter extraction.
Built in 3 1/2-inch disk drive for storage of 240 user programs or 105 measurement results.
HP-IB.
Key Points
Fully automatic high-speed DC characterization of semiconductor devices.
High resolution, wide range sourcing and measurement. I: 1pA - 100mA, V: 1mV - 100V.
Maximum 1150 measurement and display points for precise.
measurement and analysis.
Flexible graphic analysis functions for quick parameter extraction.
Built-in micro flexible disc drive for storage of 240 user programs or 105 measurement results.
Specifications
Option 050 = 50Hz Line Frequency
Option 060 = 60Hz Line Frequency
