Agilent / HP / Keysight 4279A
4279A 1MHz C-V Meter
Description
This meter offers the optimum solution for increasing quality when measuring the capacitance vs bias voltage characteristics of semiconductors.
Its measurement time can be selected from three modes of 10ms, 20ms and 30ms/meas to maximize productivity.
Key Points
C-V measurement for performing doping profile of wafers.
C-V characterization and sorting of varactor diodes.
Capacitance testing of rf mixer and switching diodes.
Testing capacitors with an applied DC bias for incoming inspection.
Measurement Time: 10ms/20ms/30ms
Measurement Accuracy: 0.1% (20ms)
Internal DC Bias: 0 to +/-38V, 0.1% programmable sweep
Measurement Range: 0.00001pF to 1280pF
Specifications
Accuracy: 0.1%
Capacitance Range: 0.00001pF - 1280.00pF
