Keithley 4200-SCS
Semiconductor Tester
Description
This Semiconductor Tester performs laboratory grade DC and pulse device characterization, real time plotting, and analysis with high precision and sub-femtoamp resolution.
It is the best tool available for interactive parametric analysis and device characterization.
It offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows XP operating system and mass storage.
Its self documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner.
Key Points
Intuitive, point and click Windows based environment
Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
New pulse and pulse I-V capabilities for advanced semiconductor testing
New scope card provides integrated scope and pulse measure functionality
Easy to use
Specifications
Instrument type: Semiconductor Characterization System
