Keithley 2520INT
Integrating Sphere
Description
This Integrating Sphere is designed to optimize the Model 2520 Pulsed Laser Diode Test System's optical power measurement capabilities.
It will allow the testing of devices with pulse widths as short as 500ns
The short pulses of the Model 2520 combined with the speed of the 2520INT makes them ideal for measuring the optical power of laser diodes at the bar or chip level, before these devices are integrated into temperature-controlled modules.
When it is connected to the Model 2520 via a low noise triax cable, the 2520INT allows the Model 2520 to make direct, high accuracy measurements of a laser diode's optical power.
The results are expressed in milliwatts.
Key Points
Optimized for laser diode pulse testing
Suitable for production and laboratory environments
Built-in germanium detector
Works seamlessly with the Model 2520 Pulsed Laser Diode Test System
Specifications
Optimized for laser diode pulse testing
Suitable for production and laboratory environments
Built-in germanium detector
Works seamlessly with the Model 2520 Pulsed Laser Diode Test System
