Agilent / HP 8517B

This S-Parameter test set has an architecture that develops a separate reference channel for each incident port. RF switching is done with a built-in electronic switch.

For active device measurements, the test sets include the ability to apply DC bias (external) to the test port center conductors.

Also available are two 60dB step attenuators, which allow control of the port 1 and port 2 signal levels.