Agilent / HP 71612B
Digital Transmission Tester 12Gb/s
Description
The Agilent 71612B Gbit tester is used to measure bit error ratio (BER) and to verify the performance and quality of your components and system hardware. The analyzer operates from 1 to 12Gb/s and will operate down to 100Mb/s with a clock-source extension.
The Agilent 71612B error performance analyzer is available with pattern generator, error detector and integral 12 GHz clock source.
The Agilent 71612B error performance analyzer can be used with optional low-rate clock. For high-performance pattern generation and error analysis across the entire 100 Mb/s to 12 Gb/s range.
The 71612B accurately characterizes Gbit systems and devices such as Lightwave submarine cable systems, SONET/SDH synchronous network transmitters and receivers, Gbit datacom serial links, Lasers and photodetectors, High-speed logic devices, optical amplifiers and Modulators, Decision circuits, Multiplexers and output drivers.
Both pattern generator and error analyzer provide a wide range of PRBS and user-defined patterns, with versatile triggering facilities. An optional error location analysis helps in identifying the address of the error bits use.
8 Mbit programmable memory allows creation of complete, structured SONET and SDH frames on the Agilent 71612B analyzer’s display.
Optional, powerful eye analysis features are enabled when the Agilent 83480A is used with an Agilent 71600 Series pattern generator. Agilent Eye line mode allows recovery of low level eye diagrams from the noise, and display of the eye diagram as continuous traces instead of dots.
Add the Agilent 71501C jitter analyzer to create a frequency agile jitter analysis system that can work at any rate up to 12 Gb/s to extend the ability to evaluate system performance.
Flexible gating capability can be enhanced with the Agilent E4543A application software to perform Q-factor measurements, or generate eye-contour diagrams to reveal even the smallest degradations in the signal, quickly and efficiently.
Features include high quality waveforms, versatile triggering, and sufficient memory for running multiple SONET and SDH frames at OC-192/STM-64.
Key Points
Exceptional waveform performance (even with reflective or poor terminations)
Display maybe totally dedicated to pattern editing
Error location analysis identifies individual errored bits in custom patterns; measure bit, block or
total pattern BER
Flexible pattern trigger allows oscilloscope to be triggered on any bit in custom pattern, allowing errored bits to be displayed on oscilloscope
Cost effective addition of 12 Gb/s jitter analysis with the Agilent 71501C jitter analyzer
Eye line display with Agilent 83480A communications analyzer
Q measurement and eye-contour analysis with Agilent E4543A application software
Test patterns
Zero substitution
Variable mark density ratio on patterns
STM-64 and STS-192 Samples supplied on disk
Measurements
Clock frequency
Error location analysis
Specifications
Frequency range: 100MHz to 12GHz
Impedance: 50ohms
<
p>Sensitivity: <200mV pp
Resolution: 1ps