Agilent / HP 4156B
Semiconductor Parameter Analyzer
Description
This unit is the next generation in precision semiconductor parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument.
This unit gives you the best digital sweep parameter analyzer plus a reliable tester, powerful failure analysis toll, and automated incoming inspection station.
It also has a wide application capability.9 Table 1 shows examples of measurements that can be made using Agilent 4156B.
Key Points
High resolution/accuracy and wide range: 1fA to 1A (20fA offset accuracy), V: 1µV to 200V
Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6SMUs
Synchronized stress/measure function, two high voltage pulse generator units (±40V)
Time domain measurement: 60µS variable intervals, up to 10,001 points
Easy to use: knob sweep similar to curve tracer, automatic analysis functions
Automation: built-in HP Instrument BASIC, trigger I/O capability
Specifications
High-resolution/accuracy and wide range: 1fA to 1A (20fA offset accuracy), V: 1µV to 200V
Fully automated I-V sweep measurements with DC or pulse mode, expandable up to 6SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (±40V)
Time domain measurement: 60µS variable intervals, up to 10,001 points
Easy to use: knob sweep similar to curve tracer, automatic analysis functions
Automation: built-in HP Instrument BASIC, trigger I/O capability
