Agilent / HP 4156A
Semiconductor Parameter Analyzer
Description
This unit is a percision semiconductor parameter analyzer.
Digital sweep parameter and a reliable tester, powereful failure analysis tool, and automated incoming inspection tool all in one package.
This unit extends the current resolution to 1fA and the accuracy of to 20fA.
It also ultilizes full kelvin remote sensing on each SMU.
All measurements are displayed on the color CRT screen and the ability to superimpose stored graphics from the graphics memory for comparison is available. Unit includes HPIB or serial output ports.
Key Points
Automatic analysis functions
Trigger I/O capability
Built-in HP Instrument BASIC
Easy to use knob-sweep similar to curve tracer
Specifications
High resolution / Accuracy: 1fA to 1A
Wide Range: 1V to 200V
Sweep Measurements: 6SMUs
Time-domain measurement: 60µS variable intervals up to 10,001 points
