Agilent / HP 4155B
Semiconductor Parametric Analyzer
Description
This unit is a stand-alone instrument capable of complete DC characterization of semiconductor devices and materials.
It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo) on a built-in CRT display.
Key Points
High-resolution/accuracy and wide range. I: 1 fA to 1A (20 fA offset accuracy), V: 1µV to 200V
Fully-automated I-V sweep measurements with DC or pulse mode,
expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator
units (±40V)
Time-domain measurement: 60µs-variable intervals, up to 10,001 points
Easy to use: knob-sweep similar to curve tracer, automatic analysis
functions
Automation: built-in HP Instrument BASIC, trigger I/O capability
Specifications
High-resolution/accuracy and wide range
1fA to 1A
1µV to 200V
Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs.
Synchronized stress/measure function, two high-voltage pulse generator units (±40V).
Time-domain measurement: 60µs–variable intervals, up to 10,001 points.
Easy to use: knob-sweep similar to curve tracer, automatic analysis functions.
Built-in HP Instrument BASIC, trigger I/O capability.
