Agilent / HP / Keysight 4155A
Semiconductor Parameter Analyzer
Description
The Agilent 4155A has four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The 4155A is best suited for basic semiconductor applications with its non-kelvin connections, 10 V resolution, and 100 mA/100 Ohm measurement range. This Analyzer offers high resolution/accuracy and a wide range; I: 1fA to 100mA (20fA offset accuracy), V: 1 micro V to 100 V. fully automated I-V sweep measurements with DC or pulse mode. expandable up to 6 SMUs. synchornized stress/measure fuction. two high voltage pulse generator units (+/- 40V). time domain mesurement: 60 micros variable intervals. up to 10,001 points, easy to use, knob sweep similar to curve tracer. automatic analysis functions. automation built in HP Instrument BASIC, trigger I/Q capability. With this unit, you can improve your semiconductor quality, from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.
Specifications
high resolution/accuracy and a wide range; I:
1fA to 100mA (20fA offset accuracy), V:
1 micro V to 100 V, fully automated I-V sweep measurements with DC or pulse mode.
expandable up to 6 SMUs, synchornized stress/measure fuction.
two high voltage pulse generator units (+/- 40V), time domain mesurement:
60 micros variable intervals.
up to 10,001 points, easy to use.
knob sweep similar to curve trace.
automatic analysis functions.
automation built in HP Instrument BASIC, trigger I/Q capability.