Agilent / HP / Keysight 37717C
37717C OmniBER 717C Communications Performance Analyzer
Description
The HP OmniBER 717 is a modular, portable analyzer that supports optical and electrical interfaces for TCarrier, PDH, SONET, SDH, ATM, jitter and LAN applications from 704 kb/s to 622 Mb/s (OC-12/STM-4).
The HP OmniBER 717 has an easy-to-read color display. It offers an extensive range of T-carrier, PDH, SONET, SDH, ATM, jitter and LAN measurements.
Each analyzer provides dedicated slots for an optical interface and the printer/ remote-control module, plus up to eight slots for other interface and measurement modules. This provides the analyzer with the flexibility to offer dedicated modules for T-Carrier, PDH, SONET/SDH, SDH only, ATM, and jitter which can be combined together in the one mainframe enabling a range of test requirements to be covered.
The test and interface modules offer a range of measurements including detailed overhead, parity and alarm testing as well
as frequency offset tolerance tests, frequency measurement and optical power measurement. The analyzers also offer enhanced test features like pointer sequence generation, overhead access and manipulation, overhead sequence generation and capture, service disruption measurement, plus thru mode capability. The structured T-carrier and PDH modules also offer ITU-T M.2100/ M.2101/M.2110/M.2120 testing with comprehensive ITU-T G.821 and G.826 in-service and out-of-service analysis. Dedicated test hardware provides all results and analysis simultaneously, so all relevant measurements are made in one test run saving time and hence money.
For transmit and receive testing of short-, intermediate and long-reach optical circuits, there is a choice of 1310 and/ or 1550 nm OC-1/STM-0, OC-3/ STM-1 and OC-12/STM-4 optical modules. Electrical interfaces at STS-1/STM-0 and STS-3/STM-1 are also available, as are jitter generation and measurement interfacing options.
Key Points
Option Description:
A1N: SDH (STM1E/10) & PDH jitter measurement (BNC)
A1T: STM-1e,DCC SDH Module for ATM
A3B: LAN,RS232-C & GP-IB
UH1: STM-1o (1310 nm)
UH4: Optical adapters - FC/PC connectors
UHK: Jitter generation module
UKN: ATM Cell at 140/34/8/2 Mb/s
UKP: Optical adapters - SC connectors
UKX: Printer Internal 24-column
UKZ: ATM Cells at DS3,DS1,E1 & E3
USL: Ethernet & Token Ring LAN
USN: Dual Wavelength (1310 nm &1550 nm)
Specifications
Easy-to-read display
Dedicated slots for optical interface, printer/remote-control module
Additional eight slots for other interface and measurement modules
Full width printing of screen (screen dump)
View events graphically with timestamps
Optical power measurements (option)
Measurement of clock frequency and amount of frequency offset; test for network clock recovery capability
Trouble Scan mode for alarm and error scan
PDH/DSn:
Alarm Scan mode to show the state of all alarms when scanning within a PDH/DSn network hierarchy
Check 64 kb/s or Nx64 kb/s digital paths (to ITU-T G.704: 1 to 31 contiguous and non-contiguous timeslots)
Access to and modification of spare bits
Generate alarms to check PDH/DSn network elements and tributary insert ports
SDH:
View the section and path overhead bytes of a received SDH signal
Overhead sequences and overhead BER measurement
RSOH or MSOH DCC drop and insert
PDH drop and insert - Drop/insert of 34/140/2 Mb/s to or from an STM-1/STM-4 signal
Pointer adjustments and analysis, and pointer location graph
Thru mode for in-service monitoring where no protected monitor points are available
SDH alarm scan (in-service) and BIP scan
Positive and negative pointer adjustments followed by analysis
Mixed payloads - Generate mixed TU-3 and TU-12 signal structures to test network elements, configured to carry mixed 2 Mb/s and 34 Mb/s traffic
Automatic verification of VC-n paths, using the out-of-service tributary scan for faster installation testing
SONET:
Overhead access and BER measurement
Drop and insert of TOH and TOH DCC channels
Pointer adjustments and analysis, and pointer location graph
SONET alarm scan (in-service) and BIP scan
DSn/PDH drop and insert
Thru mode for in-service monitoring where no protected monitor points are available
Automatic verification of VTn paths using the out-of-service tributary scan for faster installation testing
Mixed payloads - Generate mixed STS-1 signal structures within STS-3/OC-3 signal structures to test network elements
ATM:
Change cell stream bandwidth to quickly obtain quality-of-service data for the ATM network
AAL monitoring
Graphical display of maximum, mean, and minimum cell rate on a chosen VC for short or extended periods
Ping tests for Ethernet LAN interfaces
Channel view
Graphical display for 1-point and 2-point cell delay variation and non-conforming cell count
Jitter:
Automatic jitter tolerance test for verifying network equipment performance margins
Test jitter accumulation in regenerative repeaters
Jitter sweep and spot frequency
PDH and SDH output jitter measurements
