Advantest Q8381

The Q8381 is the ideal optical spectrum analyzer for use in spectrum and side mode ration analysis of DFB laser diodes. At 5 nm and 1 nm from the peak wavelength, these analyzers provide a dynamic range of 50 dB and 40 dB, respectively.

The Q8381 analyzer covers from visible light at 0.6 micro m to long wavelengths of 1.75 micro m with 0.1 nm resolution and a measurement accuracy of 0.5 nm, making them suitable for wide-dynamic-range measurements of not only laser diode spectra, but of optical-fiber or optical component loss, when teamed with the TQ8111 White light source.

An auto-function feature and a diverse range of cursor functions, automatic half-value width measurement functions, and normalization are provided to further improve operational simplicity and breadth of applications.

By minimizing the ambient light level occurring in the optics, the Q8381 achieves a dynamic range of 50 dB. This level of performance is ideal for side mode ratio measurements on DFB laser diodes.

In addition to a linear scaled level axis, the Q8381 analyzer provides logarithmic scaling, thereby enabling a measurement to be completed in less than one second. In measuring the loss versus wavelength characteristics of optical fiber and components, the previously required long measurement times have been dramatically reduced, using the analyzer’s high speed sweep mode.

The number, size and arrangement of keys have all been considered in designing these analyzers for easy operation, making them usable by virtually anyone.

For automatic peak search and side mode measurements, a 2nd-peak search function and dual-frame display which enables easy discrimination of differences between waveforms are provided. Minute differences can be clearly detected by overlapping waveforms using the superimpose function.

The Q8381 features -70dBm sensitivity over the wide wavelength range of 0.7 to 1.6 micro m. This is ideal for loss versus wavelength measurements of optical fibers and for natural emissions measurements of DFB laser diodes (EL mode).

The high grating drive system and high speed processing system provides measurement time of 1 or less seconds at 50 nm span LOG indication.

The Q8381 provides one-touch measurement of Spectrum Pulse Duration for three types of definitions: XdB, RMS and ENVELOPE methods.

The automatic function is provided for setting the wavelength and level to optimum values corresponding to input signals. The measurement spectrum peak is detected automatically, and its wavelength and level are always displayed.

A cursor function is provided with the Q8381 which allows two cursors to be used, for the wavelength axis and level axis, and not only simple wavelength and level of screen data but also difference in wavelength and level can be read easily.